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4-Point Probes
for Precise Resistivity Measurements

Applications of 4-Point Probes

MPP 4-point probes are designed for accurate resistivity measurements | -mapping of:

  • Silicon wafers

  • Epitaxial layers

  • Ion-implanted and diffused layers

  • Metallic and other thin films

They ensure reliable, reproducible measurements for semiconductor manufacturing and materials research.

mpp-4-point-probs-4.JPG

Features and Benefits

  • Ruby-guided low-friction needle movement

  • Variable tip radii and needle spacing

  • Individual needle force adjustment (50–200 gf)

  • High breakdown voltage, low leakage

  • Tungsten carbide or osmium-alloy needle tips

  • Various designs (aluminum, etc.)

  • Custom configurations

  • Refurbishment program

MPP 4-Point Probe – high-precision probe head for wafer-level resistivity measurement
MPP 4-Point Probe – high-precision probe head for wafer-level resistivity measurement
MPP 4-Point Probe – high-precision probe head for wafer-level resistivity measurement
MPP 4-Point Probe – high-precision probe head for wafer-level resistivity measurement

Still questions?

We offer you non-binding expert advice for your application.

for Germany, Austria & Switzerland

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